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Olympus BX53M Material Science Microscope

Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with PRECiV software, the BX53M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.

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Advanced Microscopy Simplified

Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with PRECiV software, the BX53M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.

BX53M

 

Choose the Best Model

Six BX53M suggested configuration provide you with flexibility to choose the features that you need.

  • For General use:  Entry, Standard, Advanced
  • For Dedicated use:  Fluorescence, Infrared, Polarization
  • Various configurations to meet users' requirements
  • Modular Design, Build Your System Your Way

Six BX53M suggested configuration

 

Comfortable and Easy to Use

The BX53M simplifies complex microscopy tasks through its well-designed and easy-to-use controls. Users can get the most out of the microscope without the need for extensive training. The easy, comfortable operation of the BX53M also improves reproducibility by minimizing human error.

  • Simple Illuminator
  • Intuitive Microscope Controls
  • Find the Focus Quickly
  • Consistent Illumination
  • Easy and Ergonomic Operation
  • Easy Restore Microscope Settings
  • Basic Measurement Functions

 

Functional

The BX53M maintains the traditional contrast methods of conventional microscopy, such as brightfield, darkfield, polarized light, and differential interference contrast. As new materials are developed, many of the difficulties associated with detecting defects using standard contrast methods can be solved using advanced microscopy techniques for more accurate and reliable inspections. New illumination techniques and options for image acquisition within PRECiV image analysis software give users more choices of how to evaluate their samples and document findings.

  • The Invisible Becomes Visible
  • Create All-in-focus Images
  • Easily Move the Stage for Panorama
  • Capture Both Bright and Dark Areas
  • Adaptable to Suit Observational and Analysis Preferences
  • Accommodates a Wide Range of Samples

PRECiV

 

Leading-Edge Optics

Olympus’ history of developing high-quality optics has resulted in a record of proven optical quality and microscopes that offer excellent measurement accuracy.

  • Superior Optical Performance
  • Stable Color Temperature and High-Intensity White LED Illumination
  • Support Precise Measurement
  • Seamless Stitching

Wave Front Aberration Control

Bad wavefront

Bad wavefront

Good wavefront (UIS2 objective)

Good wavefront (UIS2 objective)

 

Highly Reliable Modular System Concept

Never in This Simplicity

 

General Use

 

Dedicated Use

 

 

 

Entry

Easy setup with basic features

 

Standard

Simple to use with versatile upgrades

 

Advanced

Supports numerous advanced features

 

Fluorescence

Ideally suited for Fluorescence observation

 

Infrared

Designed to use Infrared observation to inspect integrated circuits

 

Polarization

Designed for observing birefringence characteristics

LCD color filter (Transmitted/BF)

LCD color filter (Transmitted/BF)

 

Microstructure with ferritic grains (Reflected/DF)

Microstructure with ferritic grains

(Reflected/DF)

 

Copper wire of coil

Copper wire of coil
(BF + DF/MIX)

 

Resist on IC pattern

Resist on IC pattern
(FL + DF/MIX)

 

Silicon layering IC pattern

Silicon layering IC pattern
(IR)

 

Asbestos

Asbestos
(POL)

Entry

 

Standard

 

Advanced

 

Fluorescence

 

Infrared

 

Polarization

 

 

Entry Standard Advanced Fluorescence Infrared Polarization
Microscope frame Reflected or Reflected/Transmitted Reflected or Reflected/Transmitted Reflected Transmitted
Standard R-BF or T-BF R-BF or T-BF or DF R-BF or T-BF or DF or MIX R-BF or T-BF or DF or FL R-BF or IR T-BF or POL
Option DIC DIC/MIX DIC DIC/MIX
Simple illuminator ■ ■
Aperture legend ■ ■ ■ ■
Coded hardware ■ ■ ■ ■
Focus scale index ■ ■ ■ ■ ■ ■
Light intensity manager ■ ■ ■ ■
Hand switch operation □ □ ■ □
MIX observation □ □ ■ □
Objectives Select from 3 objectives based on your applications Select from 3 objectives based on your applications Objectives for IR Objectives for POL
Stage Select from 5 stages based on the size of your samples Select from 5 stages based on the size of your samples Stage for POL

 

OBSERVATION METHOD

R-BF:  Brightfield (Reflected)
T-BF:  Brightfield (Reflected/Transmitted)
DF:  Darkfield
DIC:  Differential interference contrast / Simple polarization
MIX:  MIX
FL:  Fluorescence
IR:  Infrared
POL:  Polarization

*T-BF can be used when selecting Reflected/Transmitted microscope frame.

■: Standard
□: Option

 

Example Configurations for Materials Science

Modular design enables various configurations to meet users’ requirements.
Below you can find some examples of configuration for materials science.

 

BX53M Reflected and Reflected/Transmitted Light Combination

There are two types of microscope frames in the BX3M series, one for reflected light only and one for both reflected and transmitted light. Both frames can be configured with manual, coded, or motorized components. The frames are outfitted with ESD capability to protect electronic samples.

BX53MRF-S example configuration

BX53MRF-S example configuration

BX53MTRF-S example configuration

BX53MTRF-S example configuration

 

BX53M IR Combination

IR objectives can be used for semiconductor inspection, measurement, and processing applications where imaging through silicon is required to see the pattern. 5X to 100X infrared (IR) objectives are available with chromatic aberration correction from visible light wavelengths through the near infrared. For high magnification work, rotating the correction collar of the LCPLNIR series of lenses corrects for aberrations caused by sample thickness. A clear image is obtained with a single objective.

BX53M IR Combination

 

BX53M Polarized Light Combination

The optics of the BX53M polarized light provide geologists with the right tools for high-contrast polarized light imaging. Applications such as mineral identification, investigating the optical characteristics of crystals, and observing solid rock sections benefit from system stability and precise optical alignment.

BX53-P orthoscopic configuration

BX53-P orthoscopic configuration

BX53-P conoscopic/orthoscopic configuration

BX53-P conoscopic/orthoscopic configuration

 

Bertrand Lens for Conoscopic and Orthoscopic Observations

With a U-CPA conoscopic observation attachment, switching between orthoscopic and conoscopic observation is simple and fast. It is focusable for clear back focal plane interference patterns. The Bertrand field stop makes it possible to obtain consistently sharp and clear conoscopic images.

Bertrand Lens

 

An Extensive Range of Compensator and Wave Plates

Six different compensators are available for measurements of birefringence in rock and mineral thin sections. Measurement retardation level ranges from 0 to 20λ. For easier measurement and high image contrast, the Berek and Senarmont compensators can be used, which change the retardation level in the entire field of view.

An Extensive Range of Compensator and Wave Plates

 


 

Measuring Range of Compensators

Compensator Measuring Range Major Application
Thick Berek (U-CTB) 0 to 11,000 nm
(20 λ)
Measurement of High Retardation Level (R*>3λ)
(crystals, macromolecules, fiber, etc.)
Berek (U-CBE) 0 to 1,640 nm
(3 λ)
Measurement of Retardation Level
(crystals, macromolecules, living organisms, etc.)
Senarmont Compensator (U-CSE) 0 to 546 nm
(1 λ)
Measurement of Retardation Level (crystals, living organisms, etc.)
Enhancement of Image Contrast (living organisms, etc.)
Brace-Koehler Compensator
1/10λ (U-CBR1)
0 to 55 nm
(1/10 λ)
Measurement of Low Retardation Level (living organisms, etc.)
Enhancement of Image Contrast (living organisms, etc.)
Brace-Koehler Compensator
1/30λ (U-CBE2)
0 to 20 nm
(1/30 λ)
Measurement of image contrast (living organisms, etc.)
Quartz Wedge (U-CWE2) 500 to 2,200 nm
(4 λ)
Approximate Measurement of Retardation Level
(crystal, macromolecules, etc.)

*R = retardation level
For more accurate measurement, it is recommended that compensators (except U-CWE2) be used together with the interference filter 45-IF546.

 

Strain Free Optics

Thanks to Olympus’ sophisticated design and manufacturing technology, the UPLFLN-P strainfree objectives reduce internal strain to the minimum. This means a higher EF value, resulting in excellent image contrast.

 

BXFM System

The BXFM can be adapted to special applications or integrated into other instruments. The modular construction provides for straightforward adaptation to unique environments and configurations with a variety of special small illuminators and fixturing mounts.

BXFM

 

Modular Design, Build Your System Your Way

Microscope Frames

There are two microscope frames for reflected light, one also has transmitted Light; capability. An adapter is available to raise the illuminator to accommodate taller samples.

 

 

Reflected light Transmitted light Sample height
1 BX53MRF-S 0 to 65 mm
2 BX53MTRF-S 0 to 35 mm
1, 3 BX53MRF-S + BX3M-ARMAD 40 to 105 mm
2, 3 BX53MTRF-S + BX3M-ARMAD 40 to 75 mm

Convenient Accessories for Microscopy use

HP-2 Hand press
COVER-018 Dust cover

Microscope Frames

 

Stands

For microscopy applications where the sample will not fit on a stage, the illuminator and optics can be mounted to a larger stand or to another piece of equipment.

BXFM + BX53M Illuminator Configuration

1 BXFM-F Frame interface is wall mounting 32 mm pillar
2 BX3M-ILH Illuminator holder
3 BXFM-ILHSPU Counter spring for BXFM
5 SZ-STL Large stand

BXFM + U-KMAS Illuminator Configuration

1 BXFM-F Frame interface is wall mounting 32 mm pillar
4 BXFM-ILHS U-KMAS holder
5 SZ-STL Large stand

Stands

 

Tubes

For microscope imaging with eyepieces or for camera observation, select tubes by imaging type and operator’s posture during observation.

 

 

FN Type Angle type Image Number of diopter
adjustment mechanisms
1 U-TR30-2 22 Trinocular Fixing Reverse 1
2 U-TR30IR 22 Trinocular for IR Fixing Reverse 1
3 U-ETR-4 22 Trinocular Fixing Erect
4 U-TTR-2 22 Trinocular Tilting Reverse
5 U-SWTR-3 26.5 Trinocular Fixing Reverse
6 U-SWETTR-5 26.5 Trinocular Tilting Erect
7 U-TLU 22 Single port
8 U-SWATLU 26.5 Single port

Tubes

 

Illuminators

The illuminator projects light onto the sample based on the observation method selected. Software interfaces with coded illuminators to read the cube position and automatically recognize the observation method.

Coded function Light source BF DF DIC POL IR FL MIX AS/FS
1 BX3M-RLAS-S Fixed 3 cube position LED - Built in
2 BX3M-URAS-S Attachable 4 cube position LED
Halogen
Mercury/Light guide
3 BX3M-RLA-S

 

LED
Halogen
4

光源

SPECIFICATIONS OF BX53M SUGGESTED CONFIGURATION FOR GENERAL USE

 

Entry Standard Advanced
Optical system UIS2 optical system (infinity-corrected)
Main unit Microscope frame BX53MRF-S
(Reflected)
BX53MTRF-S
(Reflected/Transmitted)
BX53MRF-S
(Reflected)
BX53MTRF-S
(Reflected/Transmitted)
BX53MRF-S
(Reflected)
BX53MTRF-S
(Reflected/Transmitted)
Focus Stroke: 25 mm
Fine stroke per rotation: 100 μm
Minimum graduation: 1 μm
With upper limit stopper, torque adjustment for coarse handle
Max. specimen height Reflected:  65 mm (w/o spacer), 105 mm (with BX3M-ARMAD)
Reflected/Transmitted:  35 mm (w/o spacer), 75 mm (with BX3M-ARMAD)
Observation tube Wide field (F.N.22) U-TR30-2-2
Inverted: trinocular
Illumination Reflected light
Transmitted light
BX3M-KMA-S
White LED, BF/DIC/POL/MIX FS,
AS (with centering mechanism), BF/DF interlocking  
BX3M-RLAS-S
Coded, White LED, BF/DF/DIC/POL/MIX FS,
AS (with centering mechanism), BF/DF interlocking
BX3M-LEDT
White LED
Abbe/long working distance condensers
BX3M-LEDT
White LED
Abbe/long working distance condensers
BX3M-LEDT
White LED
Abbe/long working distance condensers
Revolving nosepiece U-5RE-2
For BF: Quintuple
U-D6BDRE
For BF/DF: Sextuple
U-D6BDRES-S
For BF/DF : Sextuple, Coded
Eyepiece(F.N.22) WHN10
WHN10X-H
MIX observation BX3M-CB
Control box
BX3M-HS
Hand switch
U-MIXR-2
MIX slider for reflected light observation
U-MIXRCBL
Cable for MIXR
Condenser (Long working distance) U-LWCD U-LWCD U-LWCD
Power cable UYCP (x1) UYCP (x2)
Weight Reflected: approx.15.8 kg (microscope frame 7.4 kg)
Reflected/transmitted: approx. 18.3 kg (microscope frame 7.6 kg)
Objectives MPLFLN set MPLFLN5X, 10X, 20X, 50X, 100X
BF/POL/FL observation
MPLFLN BD set MPLFLN5XBD, 10XBD, BD, 50XBD, 100XBD
BF/DF/DIC/POL/FL  observation
MPLFLN-BD, LMPLFLN-BD set MPLFLN5XBD, 10XBD,
MPLFLN20XBD, 50XBD, 100XBD

BF/DF/DIC/POL/FL  observation
MPLFLN-BD, MXPLFLN-BD, LMPLFLN-BD set MPLFLN5XBD, 10XBD,
MXPLFLN20XBD, 50XBD,
LMPLFLN20XBD, 50XBD, 100XBD

BF/DF/DIC/POL/FL observation
Stage (X x Y) 76 mm x 52 mm set U-SVRM, U-MSSP
Coaxial right handle stage / 76 (X) × 52 (Y) mm, with torque adjustment
100 mm x 10 0mm set U-SIC4R2, U-MSSP4
Large-size coaxial right handle stage / 100 (X) x 100 (Y) mm, with lock mechanism in Y axis
100 mm x 100 (G) mm set U-SIC4R2, U-MSSPG
Large-size coaxial right handle stage / 100 (X) x 100 (Y) mm, with lock mechanism in Y axis (Glass plate)
150 mm x 100 mm set U-SIC64, U-SHG, U-SP64
Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm, with torque adjustment, with lock mechanism in Y axis
150 mm x 100 (G) mm set U-SIC64, U-SHG, U-SPG64
Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm, with torque adjustment, with lock mechanism in Y axis (Glass plate)
Option MIX observation set* BX3M-CB, BX3M-HS, U-MIXR-2, U-MIXRCBL
DIC* U-DICR
Intermediate Tubes U-CA, U-EPA2, U-TRU
Filters

U-25ND6, U-25ND25, U-25LBD, U-25LBA, U-25Y48, U-AN360-3,
U-AN360P, U-PO3, U-POTP3, U-25IF550, U-25L42, U-25, U-25FR

Filter for condenser 43IF550-W45, U-POT
Stage plate U-WHP64, BH2-WHR43, BH2-WHR54, BH2-WHR65, U-WHP2
Specimen holder U-HRD-4, U-HLD-4, U-HRDT-4, U-HLDT-4
Handle rubber U-SHG, U-SHGT

*Cannot be used with U-5RE-2.

 

BX53M / BXFM ESD UNITS

Items Microscope frame BX53MRF-S, BX53MTRF-S
Illuminator BX3M-KMA-S, BX3M-RLA-S, BX3M-URAS-S, BX3M-RLAS-S
Nosepiece U-D6BDREMC, U-D6BDRES-S, U-D6RE-ESD, U-D5BDREMC-ESD, U-5RES-ESD
Stage U-SIC4R2, U-MSSP4

 

SPECIFICATIONS OF BX53M SUGGESTED CONFIGURATION FOR DEDICATED USE

Fluorescence Infrared Polarized
Optical system UIS2 optical system (infinity-corrected)
Main unit Microscope frame BX53MRF-S
(Reflected)
BX53MTRF-S
(Reflected/ Transmitted)
BX53MRF-S
(Reflected)
BX53MTRF-S
(Reflected/Transmitted)
Focus Stroke: 25 mm
Fine stroke per rotation: 100 μm
Minimum graduation: 1 μm
With upper limit stopper, torque adjustment for coarse handle
Max. specimen height Reflected:  65 mm (w/o spacer), 105 mm (with BX3M-ARMAD)
Reflected/Transmitted:  35 mm (w/o spacer), 75 mm (with BX3M-ARMAD)
Observation tube Wide field (F.N.22) U-TR30-2
Inverted: trinocular
U-TR30IR
Inverted: trinocular for IR
U-TR30-2
Inverted: trinocular
Polarized Light Intermediate Attachment (U-CPA) Bertrand Lens Focusable
Bertrand Field Stop ø3.4 mm diameter (fixed)
Engage or disengage Bertrand lens changeover between orthoscopic and conoscopic observation Position of slider ● in
Position of slider ○ out 
Analyzer Slot Rotatable Analyzer with Slot (U-AN360P-2)
Illumination Reflected light FL observation BX3M-URAS-S
Coded universal reflected light, 4 position mirror unit turret, (standard: U-FWUS, U-FWBS, U-FWGS, U-FBF etc) With FS, AS (with centering mechanism), With shutter mechanism
IR observation BX3M-RLA-S
100W halogen lamp for IR, BF/IR, AS (with centering mechanism)
U-LH100IR (Including 12V 10W HAL-L)
100W Halogen light source for IR
TH4-100
100W power supply
TH4-HS
Hand switch
U-RMT
Extension cord
Transmitted light POL observation BX3M-LEDT
White LED
Abbe/long working distance condensers
Revolving nosepiece U-D6BDRES-S
For BF/DF : Sextuple, Coded
U-5RE-2
For BF : Quintuple
U-P4RE
Quadruple, centerable attachable components
1/4 wavelength retardation plate (U-TAD),
tint plate (U-TP530) and various compensators can
be attached using plate adapter (U-TAD)
Eyepiece(F.N.22) WHN10X
WHN10X-H CROSS-WHN10X
Mirror units U-FDF
For DF
U-FBFL
For BF, built-in ND filter
U-FBF
For BF, detactable ND filter
U-FWUS
For Ultra Violet-FL
U-FWBS
For Blue-FL
U-FWGS
For Green-FL
Filter / Polarizer / Analyzer U-25FR
Frost filter
U-BP1100IR/U-BP1200IR
Band path filters for IR
43IF550-W45
Green filter
U-POIR
Reflected polarizer slider for IR
U-AN360IR
Rotatable analyzer slider for IR
U-AN360P-2
360° Dial-rotatable
Rotatable minimum angle 0.1°
Condenser U-LWCD
Long working distance
U-POC-2
Achromat strain-free condenser.
360°rotatable polarizer
with swing-out achromatic top-lens.
Click stop at position "0°" is adjustable.
NA 0.9 (top-lens in)
/ NA 0.18 (top-lens out)
Aperture iris diaphragm:
adjustable from 2 mm to 21 mm diameters
Slider / Compensators U-TAD
Slider (Plate adapter)
U-TP530
Tint plate
U-TP137
1/4 wavelength retardation plate
Power cable UYCP (x1) UYCP (x2) UYCP (x1)
Weight Reflected: approx.15.8 kg (microscope frame 7.4 kg) Reflected/transmitted: approx. 18.3 kg (microscope frame 7.6 kg)  Approx.18.9 kg (microscope frame 7.4 kg) Approx.16.2 kg (microscope frame 7.6 kg)
Reflected FL light source Light guide U-LGPS, U-LLGAD, U-LLG150, Light guide set
Mercury lamp

U-LH100HGAPO1-7,
USH-103OL (x2), U-RFL-T,
U-RCV
 Mercury lamp set

Objectives MPLFLN set MPLFLN5X, 10X, 20X, 50X, 100X
BF/DIC/POL/FL observation
MPLFLN BD set MPLFLN5XBD, 10XBD, BD, 50XBD, 100XBD
BF/DF/DIC/POL/FL  observation
MPLFLN-BD, LMPLFLN-BD set MPLFLN5XBD, 10XBD,
LMPLFLN20XBD, 50XBD, 100XBD

BF/DF/DIC/POL/FL  observation
MPLFLN-BD, MXPLFLN-BD, LMPLFLN-BD set MPLFLN5XBD, 10XBD,
MXPLFLN20XBD, 50XBD,
MPLFLN20XBD, 50XBD, 100XBD

BF/DF/DIC/POL/FL observation
IR set LMPLN5XIR,10XIR,
LCPLN20XIR,50XIR,100XIR

IR observation
POL set UPLFLN4XP,10XP,20XP,40XP
POL observation
Stage (X x Y) 76 mm x 52 mm set U-SVRM, U-MSSP
Coaxial right handle stage / 76 (X) × 52 (Y) mm,
with torque adjustment
100 mm x 10 0mm set U-SIC4R2, U-MSSP4
Large-size coaxial right handle stage / 100 (X) x 100 (Y) mm,
with lock mechanism in Y axis
100 mm x 100 (G) mm set U-SIC4R2, U-MSSPG
Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm,
with lock mechanism in Y axis (Glass plate)
150 mm x 100 mm set U-SIC64, U-SHG, U-SP64
Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm,
with torque adjustment, with lock mechanism in Y axis
150 mm x 100 (G) mm set U-SIC64, U-SHG, U-SPG64
Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm,
with torque adjustment, with lock mechanism in Y axis (Glass plate)
POL set U-SRP+U-FMP
Polarizing rotatable stage + Mechanical stage
Option MIX observation set* BX3M-CB, BX3M-HS, U-MIXR-2, U-MIXRCBL
DIC* U-DICR
Intermediate Tubes U-CA, U-EPA2, U-TRU
Filters U-25ND6, U-25ND25, U-25LBD, U-25LBA, U-25Y48,
U-AN360-3, U-AN360P, U-PO3, U-POTP3, U-25IF550, U-25L42, U-25, U-25FR
Filter for condenser 43IF550-W45, U-POT
Stage plate U-WHP64, BH2-WHR43, BH2-WHR54, BH2-WHR65, U-WHP2
Specimen holder U-HRD-4, U-HLD-4, U-HRDT-4, U-HLDT-4
Handle rubber U-SHG, U-SHGT

*Cannot be used with U-5RE-2

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