Olympus DSX1000 Digital Microscope

DSX1000 Digital Microscope

Powerful Analysis, Dynamic Imaging.
The DSX1000 digital microscope combines ease of use with advanced features to streamline your inspection workflow.

Large selection of lenses that are easy to change
Switch between 6 different observation methods by pushing a button
Fast macro to micro viewing
Accurate measurements with a telecentric optical system
Advanced measurements are fast and easy to obtain

DSX1000 Digital Microscope

DSX1000 Digital Microscope Models

Choose the DSX1000 digital microscope that best suits your needs.

Entry Model

Tilt Model

High-Resolution Model

High Resolution Model

High-End Model

High End Model

Easy to Use with Basic

Functionality

Standard zoom head, offering

5 observation methods.

See Your Sample from

Many Angles

Offers all the features of the

Entry model and adds a tilting

frame, motorized XY stage,

and console.

High-Resolution Images for

Advanced Analysis

Universal zoom head adds

differential interference

contrast imaging, enhanced

depth of focus, and

high-resolution 3CMOS mode.

6 Observation Methods and

Advanced Measurement Functions

Packed with advanced features,

this model features the universal

zoom head and adds a tilting

frame and motorized XY stage

with rotation (+ 90°).

DSX1000 Objective Lenses

Our lineup of 17 objective lenses, including super long working distance and high numerical aperture options, offers flexibility to obtain a wide range of images.

Super Long Working
Distance Objective Lens

Provides a long working distance

between the lens and sample.

Super Long Working Distance Objective Lens

High-Resolution, Long Working
Distance Objective Lens

Delivers both high resolution and

a long working distance.

High-Resolution, Long Working Distance Objective Lens

High-Performance, High Numerical
Aperture Objective Lens

Delivers high performance at the nano scale.

High-Performance, High Numerical Aperture Objective Lens

Digital Microscope for Failure Analysis

Speed combined with guaranteed accuracy and repeatability make the DSX1000 digital microscope the right tool for fast failure analysis.

dsx1000

Macro to Micro Versatility

Preliminary Inspection and Micron-Level Analysis with One System

See the whole picture: 23X to 8220X magnification range
Minimize the chance of crashing into your sample
See your sample from many angles

Supported models

Multiple Observations with a Single Click

Instant Switching Saves Time

All observation methods are available at all magnifications
Choose from 6 observation methods, and switch between them with a single click

Supported models

Be Confident in Your Results

Guaranteed* Measurement Accuracy and Precision

You can be confident in your measurement results with guaranteed* measurement precision
Reliable measurement with on-site calibration

You can be confident in your measurement results with guaranteed* measurement precision

Supported models

可用的 DSX 型号

*To guarantee XY accuracy, calibration work must be undertaken by an Olympus service technician.

Advanced Measurements Are Fast and Easy to Obtain

Improved analysis functions make the DSX1000 digital microscope a powerful and versatile inspection tool

Supports complex measurement, including profile , inter-surface step, surface roughness, and more.
Faster analyses with advanced easy-to-use functions

Advanced Measurements Are Fast and Easy to Obtain

Supported models

5 Advantages of the DSX1000 Series Digital Microscope Over Conventional Digital Microscopes

01 All-in-One System with a

Wide Magnification Range

With the DSX1000 digital microscope:

Complete your inspection using one

easy-to-use system

With a conventional digital microscope:

Two microscopes, a low-magnification and

a high-magnification model, are needed to complete an inspection

02 High-Resolution Image

at High Magnification

With the DSX1000 digital microscope:

High resolution and long working

distance in one objective

With a conventional digital microscope:

Resolution decreases as magnification increases

03 Long Working Distance Objectives

With the DSX1000 digital microscope:

Observe uneven samples without bumping into them

With a conventional digital microscope:

The objective can crash into the sample,

potentially damaging it

04 Multiple Observations with a Single Click

With the DSX1000 digital microscope:

All 6 observation methods are available at all magnifications

With a conventional digital microscope:

Only one or two observation methods are available,

limiting what can be seen in the sample

05 Guaranteed Accuracy and Precision

With the DSX1000 digital microscope:

Both accuracy and repeatability are guaranteed at all magnifications

With a conventional digital microscope:

The measurement precision is not guaran teed

Service and Support You Can Trust

From calibration to training, we offer a broad portfolio of services to help you maintain optimal device performance. Evident service contracts are:

Straightforward—so you can focus on the core of your business
Efficient—we can schedule preventative maintenance, including calibrations, on your behalf
Cost-effective—providing you savings throughout the life of the contract

DSX1000

DSX1000 Application Notes

Improve the Speed and Efficiency of Your Inspection with Image Analysis Software

OLYMPUS Stream Software

The software offers fast, efficient inspection workflows for image acquisition, quantitative measurements and image analysis, reporting, and advanced materials science inspection tasks.

OLYMPUS Stream Software

DSX1000 Applications

Perform Highly Accurate Thickness Measurements of the Internal Layer of a Multilayer Ceramic Condenser

Perform Highly Accurate Thickness Measurements

of the Internal Layer of a Multilayer Ceramic Condenser

Multilayer ceramic condensers (MCLLs) have been attracting attention and it has found widespread

use in applications ranging from mobile terminals to automobiles. Moreover, it is expected that

large quantities of MCLLs will be incorporated into 5G devices. The DSX1000 it easy to

measure thickness of the Internal layer of MCLLs with high resolution.

Electronics IC/Wafer

Using a Digital Microscope for Precise Burr Measurement on Injection-Molded Products

Olympus' DSX1000 digital microscope makes it easier to obtain optimal images that facilitate the

quality control of burrs on injection-molded components. It comes equipped with various functions

that enable you to acquire images at the desired magnification, observation method, and

illumination angle, and an image-processing function.

Metal
Fabrication/Mold

Measuring the Thickness of Automotive Pipe Coatings Using a Digital Microscope

In the quality control process, inspectors must assess coating thicknesses to make sure they meet

specifications and check for thickness variations. DSX1000 provides pattern matching and shading

correction algorithms that enable you to stitch images together.

Automotive

Inspecting Burrs on Pistons Using a Digital Microscope

If there are burrs in the piston’s grooves, it can lead to serious engine issues. DSX1000

offers "Observe small burrs with clear images at low magnification" , "Instantly switch to a

higher magnification objective to analyze burrs" and " See the piston ring groove from different

angles with a tilting frame" and provide efficient workflow.

Automotive

Observing the Metal Flow in Forged Products Using a Digital Microscope

There are many parts that are forged, such as gears, valves, and connecting rods used in

automobiles. DSX1000 can observe the metal flow that affects toughness using the auto-stitching

function.

Metal
Fabrication/Mold

Inspecting the Brazed Joints of Radiator Fins Using a Digital Microscope

Radiator are important role in engine cooling and it is essential to confirm the brazing of pipes

and fins for quality control. DSX1000's multi-preview function makes it simple to view the sample

using multiple observation methods to find the right one and makes inspections more efficient.

Automotive

Measuring a Connecting Rod’s Slit Width Using a Digital Microscope

Connecting rods are required to be strong enough to withstand tens of millions of revolutions

per minute, and the slit width is strictly controlled. With the DSX1000, the slit width that could not

be clearly observed with a conventional microscope can be observed with high accuracy.

Automotive

Inspecting the Surface of Brake Pads

Inspecting a Brake Pad’s Surface using a Digital Microscope

A brake pad's surface impacts its performance, including braking force, heat stability, noise, and

heat generation. Digital microscopes are used to check that the compounds used to create the

brake pad are mixed properly.

Automotive

Inspecting the Appearance of Bonding Wire

Inspecting Bonding Wires Using a Digital Microscope

Digital microscopes are effective tools for analyzing defects, such as wire breakage, wire pitch

deviation, bonding peeling, and migration that can occur during the bonding process.

Electronics
IC/Wafer

Detecting Damage on a Drill Bit Edge Using a Digital Microscope

Drill bits are widely used in industrial fields as a cutting tool. If the edge is damaged,

inaccuracies may arise during hole positioning, or the drill may break. Conventional digital

microscope is commonly used to perform drill inspection, but there are challenges.

The DSX1000 offers advantages of detecting damage on a drill bit edge.

Metal
Fabrication/Mold

Detecting Manufacturing Defects on Semiconductor Wafers Using a Digital Microscope

Semiconductors are essential components in many electronic devices. Defects can be

introduced into the circuit during manufacturing process, and visual inspection using a

microscope is a preferred option to inspect defects. The DSX1000 simplifies semiconductor

visual inspection.

Electronics
IC/Wafer

How a Digital Microscope’s Deep Focal Depth Enables the Complete Inspection of Connector Pins

Manufacturers use strict quality control measures to minimize failures of electrical

connector pins, and microscopes play an essential role. The DSX1000 microscope’s

objective lenses offer the depth of focus and resolution required to focus an entire connector

pin at the same time, greatly simplifying and speeding up the inspection process.

Electronics
IC/Wafer

Analyzing Fractured Metal Surfaces with a Digital Microscope

Fractography has become increasingly important as infrastructure continues to age and quality

control issues cause problems. Optical or digital microscopes are essential fractography tools

that are used to capture high-quality images for analysis. See details of advantages which

DSX1000 can offer to analyze factured metal surfaces.

Metal
Fabrication/Mold

Inspecting the Appearance of Bonding Wire

Measuring the Volume of Integrated Circuit Chipping After the Dicing Process Using a Digital Microscope

During the dicing process of integrated circuit (IC) manufacturing, amount of allowable

roughness of wafer surface is carefully controlled. Amount of roughness is checked with a digital

microscope, but the physical properties of IC chips can be challenging. The DSX1000 objective

lenses offer high resolution at low magnification to reduce shading and flare, enabling inspectors

to more easily see chipping during low-magnification observations.

Electronics
IC/Wafer

Acquiring Clear Images and Accurate Dimension Measurements of a Laminated Ceramic Capacitor Using a Digital Microscope

Inspecting Glass Fiber Peeling in a Printed Wiring Board’s Glass Epoxy Substrate—

Clear Images Are Essential for Quality Control

Inspection of resin peeling defects is critical as these defects can cause a completed PWB to

have lower insulation and heat resistance, making them more susceptible to failure. PWBs are

challenging to inspect with a microscope. The DSX1000 digital microscope has advanced

telecentric optics and high-resolution objectives that offer an excellent depth of focus, which

enable you to observe an etched PWB to investigate the cause of a defect.

Electronics
IC/Wafer

Measuring the Circuit Shape of a Printed Wiring Board Using a Digital Microscope

Acquiring Clear Images and Accurate Dimension Measurements of a

Laminated Ceramic Capacitor Using a Digital Microscope

Manufacturers measure the laminated ceramic capacitors’ dimensions and visually

inspect them to look for cracks in the ceramic. Microscopes or digital microscopes is used to

supplement the automated inspection system, but poses challenges. The DSX1000

offers multiple advantages to inspect capacitors.

Electronics
IC/Wafer

Measuring the Circuit Shape of a Printed Wiring Board Using a Digital Microscope

During the manufacturing process of PWBs, a microscopic inspection is necessary to analyze

circuit shape precisely. There are multiple advantages of measuring circuit shape

with the DSX1000.

Electronics
IC/Wafer

Automotive

电子器件、集成电路/晶圆

Electronics
IC/Wafer

金属制品/模具

Metal Fabrication/Mold

化学品/材料、玻璃和陶瓷

Chemical/Materials,

Glass, and Ceramics

Other

DSX1000 Digital Microscope Specifications

			DSX10-SZH	DSX10-UZH
Optical System	Optical system		Telecentric optical system
	Zoom ratio		10X (motorized)
	Zoom magnification method		Motorized
	Calibration		Automatic
	Lens attachment		Quick-switch, coded lens attachments automatically update magnification and visual field information
	Maximum total magnification (on a 27-inch monitor)		8220X
	Working distance (W.D.)		66.1 mm – 0.35 mm
	Accuracy and repeatability (X-Y plane)	Accuracy*1	± 3%
		Repeatability 3σn-1	2%
	Repeatability (Z axis)*2	Repeatabilty σn-1	1 μm
Camera	Image sensor		1 / 1.2 inch, 2.35 million pixel color CMOS
	Cooling		Peltier cooling
	Frame rate		60 fps (maximum)
	Standard		1200 × 1200 (1: 1) / 1600 × 1200 (4: 3)
	3 CMOS mode		Not available	1200 × 1200 (1: 1) / 1600 × 1200 (4: 3)
	3 CMOS mode × pixel shift		Not available	3600 × 3600 (1: 1) / 4800 × 3600 (4: 3)
Illumination	Color light source		LED
	Lifetime		60,000 h (design value)
Observation	BF (brightfield)		Standard
	OBQ (oblique)		Standard
	DF (darkfield)		Standard LED ring divided into four divisions
	MIX (brightfield+darkfield)		Standard Simultaneous observation of BF + DF
	PO (polarization)		Standard
	DIC (differential interference)		Not available	Standard
	Contrast up		Standard
	Depth of focus up function		Not available	Standard
	Transmitted lighting		Standard*3
Focus	Focusing		Motorized
	Stroke		101 mm (motorized)

*1 Calibration by Olympus or dealer service technician necessary. To guarantee the accuracy of XY, calibration with DSX-CALS-HR (calibration sample) is required. To issue certificates, calibration work must be undertaken by an Olympus’ calibration service technician.
*2 When using a 20X or higher objective.
*3 The optional DSX10-ILT is required.

Objective		DSX10-SXLOB	DSX10-XLOB	UIS2
Objective lens	Maximum sample height	50 mm	115 mm	145 mm
	Maximum sample height (free angle observation)	50 mm
	Parfocal distance	140 mm	75 mm	45 mm
	Lens attachment	Integrated with lens	Available
	Total magnification (on a 27-inch monitor)	23 – 1644X	49 – 6570X	26*4 – 8220X
	Actual F.O.V. (μm)	19,200 µｍ – 270 µｍ	9,100 µｍ – 70 µｍ	17,100 µｍ – 50 µｍ
Adaptor	Diffusion adaptor (optional)	Available	Not Available
Adaptor	Eliminate reflection adaptor (optional)	Available	Not Available
Lens attachment	Number of objectives that can be attached	Up to 1 piece (attachment is integrated with lens)	Up to 2 pieces
Objective lens case		Three lens attachments can be stored

*4 Total (maximum) magnification when using MPLFLN1.25X

Stage	DSX10-RMTS	DSX10-MTS	U-SIC4R2
XY stage: motorized / manual	Motorized (with rotation function)	Motorized	Manual
XY stroke	Stroke priority mode: 100 mm × 100 mm Rotation priority mode: 50 mm × 50 mm	100 mm × 100 mm	100 mm × 105 mm
Rotation angle	Stroke priority mode : ±20° Rotation priority mode : ±90°	Not available
Display rotation angle	GUI	Not available
Load-resistance	5 kg (11 lb)		1 kg (2.2 lb)

Frame	DSX-UF	DSX-TF
Z-axis stroke	50 mm (manual)
Tilt observation	Not available	±90°
Tilt angle display	Not available	GUI
Tilt angle method	Not available	Manual, fix / release handle

Measurement	Plane measurement
	Profile measurement
	Step measurement
	Step height measurement
	Area/volume measurement
	Line roughness analysis
	Surface roughness analysis
	Auto edge measurement
	Particle analysis
	Difference measurement
	Sphere/cylinder surface angle analysis
	Multi-data analysis*

*Requires Experimental total assist application software (optional)

Display	27-inch flat panel display
Resolution	1920 (H) × 1080 (V)

System total	Upright frame system	Tilt frame system
Weight (frame, head, motorized stage, display, and console)	43.7 kg (96.3 lb)	46.7 kg (103 lb)
Power consumption	100 – 120 V / 220 – 240 V, 1.1 / 0 .54 A, 50 / 60 Hz